Defense & Aerospace · High-Reliability Testing – China Academy of Engineering Physics, Institute of Electronic Engineering

Product used: Rapid temperature change (damp heat) chamber

Temperature range: -70°C ~ 150°C

Ramp rate: 15°C/min adjustable

Application: Provided stress screening equipment for key national defense programs to evaluate reliability and lifetime of electronic components under extreme temperature transients. The chamber ran continuously for 1,200 hours without any failure, with precise ramp rate control supporting stringent military reliability validation.

“The stability of the Baoyt equipment exceeded our expectations. Under strict defense project acceptance criteria, its temperature accuracy and long-term reliability performed exceptionally.” – Project Lead